Source: Journal of Applied Crystallography. Unidade: IF
Assunto: RAIOS X
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ABNT
MORELHÃO, Sergio L et al. X-ray phase measurements as a probe of small structural changes in doped nonlinear optical crystals. Journal of Applied Crystallography, v. fe 2011, n. 1, p. 93-101, 2011Tradução . . Disponível em: https://doi.org/10.1107/S0021889810042391. Acesso em: 03 maio 2024.APA
Morelhão, S. L., Remédios, C. M. R., Freitas, R. O., & Santos, A. O. dos. (2011). X-ray phase measurements as a probe of small structural changes in doped nonlinear optical crystals. Journal of Applied Crystallography, fe 2011( 1), 93-101. doi:10.1107/S0021889810042391NLM
Morelhão SL, Remédios CMR, Freitas RO, Santos AO dos. X-ray phase measurements as a probe of small structural changes in doped nonlinear optical crystals [Internet]. Journal of Applied Crystallography. 2011 ; fe 2011( 1): 93-101.[citado 2024 maio 03 ] Available from: https://doi.org/10.1107/S0021889810042391Vancouver
Morelhão SL, Remédios CMR, Freitas RO, Santos AO dos. X-ray phase measurements as a probe of small structural changes in doped nonlinear optical crystals [Internet]. Journal of Applied Crystallography. 2011 ; fe 2011( 1): 93-101.[citado 2024 maio 03 ] Available from: https://doi.org/10.1107/S0021889810042391